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Thickness dependence of magnetoresistance in La–Ca–Mn–O epitaxial films

 

作者: S. Jin,   T. H. Tiefel,   M. McCormack,   H. M. O’Bryan,   L. H. Chen,   R. Ramesh,   D. Schurig,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 67, issue 4  

页码: 557-559

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.115168

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Colossal magnetoresistance in excess of 106% has been obtained (at 110 K,H=6 T) in epitaxially grown La–Ca–Mn–O thin films. The as‐deposited film exhibits a substantial magnetoresistance value of 39 000%, which is further improved by heat treatment. The magnetoresistance is found to be strongly dependent on film thickness, with the value reaching the maxima at ∼1000 A˚ thickness, and then reduced by orders of magnitude when the film is made thicker than ∼2000 A˚. This behavior is interpreted in terms of lattice strain in the La–Ca–Mn–O films. ©1995 American Institute of Physics.

 

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