Thickness dependence of magnetoresistance in La–Ca–Mn–O epitaxial films
作者:
S. Jin,
T. H. Tiefel,
M. McCormack,
H. M. O’Bryan,
L. H. Chen,
R. Ramesh,
D. Schurig,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 4
页码: 557-559
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.115168
出版商: AIP
数据来源: AIP
摘要:
Colossal magnetoresistance in excess of 106% has been obtained (at 110 K,H=6 T) in epitaxially grown La–Ca–Mn–O thin films. The as‐deposited film exhibits a substantial magnetoresistance value of 39 000%, which is further improved by heat treatment. The magnetoresistance is found to be strongly dependent on film thickness, with the value reaching the maxima at ∼1000 A˚ thickness, and then reduced by orders of magnitude when the film is made thicker than ∼2000 A˚. This behavior is interpreted in terms of lattice strain in the La–Ca–Mn–O films. ©1995 American Institute of Physics.
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