REVERSIBLE CHANGES IN TRANSISTOR CHARACTERISTICS CAUSED BY SCANNING ELECTRON MICROSCOPE EXAMINATION
作者:
D. Green,
J. E. Sandor,
T. W. O'Keeffe,
R. K. Matta,
期刊:
Applied Physics Letters
(AIP Available online 1965)
卷期:
Volume 6,
issue 1
页码: 3-4
ISSN:0003-6951
年代: 1965
DOI:10.1063/1.1754122
出版商: AIP
数据来源: AIP
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