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Effect of hydrogenation on misfit dislocations in SiGe/Si structures for photovoltaic applications

 

作者: A. Daami,   G. Bremond,   M. Caymax,   J. Poortmans,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1998)
卷期: Volume 16, issue 3  

页码: 1737-1739

 

ISSN:1071-1023

 

年代: 1998

 

DOI:10.1116/1.590045

 

出版商: American Vacuum Society

 

关键词: (Si,Ge)

 

数据来源: AIP

 

摘要:

ThickSi0.9Ge0.1relaxed layers grown by chemical vapor deposition on Si(100) oriented substrates are investigated by photoluminescence (PL) spectroscopy. Resolved excitonic near-band-gap luminescence is observed in as-grown and hydrogen treated samples. Phonon assisted transitions are also well identified. The effect of hydrogenation is to enhance the luminescence related to the near-band gap. This enhancement is correlated with a quenching in the dislocation related PL especially for the D3–D4 bands and the T band. This indicates that hydrogenation passivates radiative centers inside dislocation cores which are responsible, beside nonradiative channels, for the quenching of SiGe band-gap edge luminescence.

 

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