A new x-ray diffraction method for structural investigations of solid-liquid interfaces
作者:
Willem Jan Huisman,
J. F. Peters,
J. W. Derks,
H. G. Ficke,
D. L. Abernathy,
J. F. van der Veen,
期刊:
Review of Scientific Instruments
(AIP Available online 1997)
卷期:
Volume 68,
issue 11
页码: 4169-4176
ISSN:0034-6748
年代: 1997
DOI:10.1063/1.1148380
出版商: AIP
数据来源: AIP
摘要:
A synchrotron x-ray diffraction method is presented for structural investigations of interfaces between low-Z substrates and heavier liquids. The method, similar to methods used in neutron scattering, is based on illuminating the interface through the solid substrate. The backgrounds arising from bulk scattering and the signal-to-background ratio are estimated and compared with experimental results. An ultrahigh vacuum (UHV) setup is described in which the atomic arrangement and roughness of clean interfaces can be studiedin situ. Our first results illustrate the possibilities for both out-of-plane and in-plane diffraction studies. The specular reflectivity of the Ga/diamond(111)-2×1 interface was measured for perpendicular momentum transfers up to 2.2Å−1. In an in-plane study of Ga/Si(111)-7×7 the in-plane structure factor of Ga liquid within a depth of∼50 Å was compared to the structure factor of the bulk liquid. ©1997 American Institute of Physics.
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