In situ near infrared evanescent wave examination of surfactant adsorption on silica optical fibers
作者:
A.K. Liao,
W.M. Cross,
R.M. Winter,
J.J. Kellar,
期刊:
Composite Interfaces
(Taylor Available online 1994)
卷期:
Volume 2,
issue 3
页码: 187-197
年代: 1994
DOI:10.1163/156855494X00085
出版商: Taylor & Francis Group
关键词: FT-IR;silica fiber;surfactant adsorption;n-dodecylamine hydrochloride
数据来源: Taylor
摘要:
The use of composite materials has increased considerably in the past 30 years. However, many of the molecular level processes occurring in the interfacial region have yet to be investigated. In this regard, an in situ Fourier transform near infrared technique has been demonstrated herein. This technique utilizes a seven-fiber bundle to examine monolayer and sub-monolayer level surfactant adsorption at the silica optical fiber/solution interface. It is felt that this technique will greatly increase the knowledge of the processes involved in the improvement of mechanical properties of silane treated composites.
点击下载:
PDF (1722KB)
返 回