首页   按字顺浏览 期刊浏览 卷期浏览 In situ near infrared evanescent wave examination of surfactant adsorption on silica op...
In situ near infrared evanescent wave examination of surfactant adsorption on silica optical fibers

 

作者: A.K. Liao,   W.M. Cross,   R.M. Winter,   J.J. Kellar,  

 

期刊: Composite Interfaces  (Taylor Available online 1994)
卷期: Volume 2, issue 3  

页码: 187-197

 

年代: 1994

 

DOI:10.1163/156855494X00085

 

出版商: Taylor & Francis Group

 

关键词: FT-IR;silica fiber;surfactant adsorption;n-dodecylamine hydrochloride

 

数据来源: Taylor

 

摘要:

The use of composite materials has increased considerably in the past 30 years. However, many of the molecular level processes occurring in the interfacial region have yet to be investigated. In this regard, an in situ Fourier transform near infrared technique has been demonstrated herein. This technique utilizes a seven-fiber bundle to examine monolayer and sub-monolayer level surfactant adsorption at the silica optical fiber/solution interface. It is felt that this technique will greatly increase the knowledge of the processes involved in the improvement of mechanical properties of silane treated composites.

 

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