Instrument for Measuring the Magnetomicrowave Kerr Effect in Semiconductors
作者:
Morris E. Brodwin,
Ronald J. Vernon,
期刊:
Review of Scientific Instruments
(AIP Available online 1963)
卷期:
Volume 34,
issue 10
页码: 1129-1132
ISSN:0034-6748
年代: 1963
DOI:10.1063/1.1718150
出版商: AIP
数据来源: AIP
摘要:
An instrument is described which measures the transport properties of high‐conductivity semiconductors. It employs a microwave turnstile junction to determine the complex orthogonal amplitudes of the reflected waves from a magnetized sample. The data are obtained by a double‐bridge technique of high sensitivity. Some experimental results on germanium at room temperature are presented.
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