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Space‐charge aberrations in the photoelectron microscope

 

作者: G. A. Massey,   M. D. Jones,   B. P. Plummer,  

 

期刊: Journal of Applied Physics  (AIP Available online 1981)
卷期: Volume 52, issue 6  

页码: 3780-3786

 

ISSN:0021-8979

 

年代: 1981

 

DOI:10.1063/1.329216

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The contributions of space charge to chromatic and trajectory aberrations of accelerating electrons in a laser‐illuminated photoelectron microscope are calculated. Average and fluctuating components of the electrostatic forces on the particles are considered spearately. The average forces produce a magnification change but no chromatic spread. Fluctuating effects include relaxation of potential to kinetic energy in a beam obeying Poisson emission statistics, and transverse‐to‐longitudinal velocity relaxation by multiple scattering. The potential energy relaxation is treated in a new way by modifying the Poisson distribution with position along the beam axis. The field fluctuations produce both chromatic and trajectory spreading effects, the latter being much larger at high currents. The resolution limit is about 500 A˚ for 30‐kV electrons in a beam of 1‐A/cm2current density.

 

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