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Modification of the M‐DRIS for soybean1

 

作者: W. B. Hallmark,   R. B. Beverly,   H. F. Morris,   D. A. Wall,  

 

期刊: Communications in Soil Science and Plant Analysis  (Taylor Available online 1994)
卷期: Volume 25, issue 7-8  

页码: 1085-1101

 

ISSN:0010-3624

 

年代: 1994

 

DOI:10.1080/00103629409369100

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

Previous research shows that the diagnosis and recommendation integrated system (DRIS) and modified‐DRIS (M‐DRIS) have inherently biased data base means and CV's that affect the accuracy of nutrient diagnoses. Our objective was to remove these biases and determine their effect on phosphorus (P) and potassium (K) diagnoses for soybean (Glycine maxL.). Four sets of soybean M‐DRIS nutrient norms (linear, L; log‐transformed, LT; corrected anti‐log, CAL; and corrected anti‐log population, CALP) were derived for use in evaluating P and K deficiencies and sufficiencies. The four data bases differed in that: (i) the L, LT, and CAL norms were developed from 639 soybean leaf samples yielding in excess of 3500 kg/ha, while those for CALP were calculated from 3898 samples from all available yield levels, (ii) L norms were calculated from non‐log‐transformed nutrient data, while LT, CAL, and CALP norms were calculated from log‐transformed data, and (iii) CAL and CALP concentration means were developed by taking the anti‐log of their LT concentration means and CAL and CALP ratio means were calculated directly from their anti‐log concentration means. Results show that biased means and CV's for L produced inflated function and index values, which resulted in an over‐emphasis of P and K deficiencies compared with CAL. While log‐transforming data used to derive nutrient norms resulted in removal of mathematical biases from the means and CV's, use of LT norms also over‐ emphasized P and K deficiencies compared with CAL. Phosphorus and K diagnoses by CAL and CALP did not differ, indicating that leaf analyses from all appropriate plants may be used to derive corrected anti‐log norms without regard to yield level.

 

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