Tilting Stretching Stage for the Elmiskop Electron Microscope
作者:
V. A. Phillips,
J. A. Hugo,
期刊:
Review of Scientific Instruments
(AIP Available online 1962)
卷期:
Volume 33,
issue 8
页码: 854-855
ISSN:0034-6748
年代: 1962
DOI:10.1063/1.1717990
出版商: AIP
数据来源: AIP
摘要:
In studying the mechanism of deformation, it is often desirable to be able to stretch a thin sample inside an electron microscope while the specimen is under observation. Dislocation movements and interactions can be directly observed. A new specimen stretching stage for the Siemens Elmiskop electron microscope is described which combines the advantages of tilting, fast response, sensitivity, and reversibility. A uniform strain is applied.
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