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Optically detected microwave‐induced impact ionization of ytterbium bound excitons in InP

 

作者: B. J. Heijmink Liesert,   M. Godlewski,   A. Stapor,   T. Gregorkiewicz,   C. A. J. Ammerlaan,   J. Weber,   M. Moser,   F. Scholz,  

 

期刊: Applied Physics Letters  （AIP Available online 1991）
卷期: Volume 58, issue 20  

页码: 2237-2239

 

ISSN:0003-6951

 

年代: 1991

 

DOI:10.1063/1.104937

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Optically detected microwave‐induced impact ionization of excitons and shallow donors is studied in Yb‐doped InP grown by metalorganic chemical vapor deposition. The experimental results directly confirm that Yb3+intrashell emission is induced by nonradiative recombination of Yb bound excitons due to an impurity Auger effect. Yb3+ions in InP are found to bind excitons with the electron being localized first, followed by subsequent hole capture.

 

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