The depth profiles of ion implantation induced vacancy-type defects probed by a monoenergetic positron beam
作者:
Akira Uedono,
Long Wei,
Shoichiro Tanigawa,
Jun Sugiura,
Makoto Ogasawara,
Masao Tamura,
期刊:
Radiation Effects and Defects in Solids
(Taylor Available online 1992)
卷期:
Volume 124,
issue 1
页码: 31-41
ISSN:1042-0150
年代: 1992
DOI:10.1080/10420159208219825
出版商: Taylor & Francis Group
关键词: positron annihilation;monoenergetic positron beam;defect;oxygen-vacancy complex;ion implantation;silicon
数据来源: Taylor
摘要:
Vacancy-type defects in ion implanted Si specimens were studied by a monoenergetic positron beam. Dominant defect species in 80-keV B+-implanted specimen were identified as vacancy clusters from their annealing behavior. For 150-keVP+-implanted specimen, oxygen atoms recoiled from a SiO2film grown on Si substrate were found to form stable complexes with vacancy-type defects in the Si substrate near the SiO2/Si interface. Since the migration of vacancy-type defects was blocked by such complexes, the final recovery of defects for the P+-implanted specimen occured at higher annealing temperatures than that for the B+-implanted one. For 2-MeVP+- implanted specimen, two types of oxygen-vacancy complexes were found to coexist even after annealing at 1200°C.
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