A combined Monte Carlo diode simulation code
作者:
J. P. Quintenz,
M. M. Widner,
期刊:
Journal of Applied Physics
(AIP Available online 1980)
卷期:
Volume 51,
issue 9
页码: 4688-4692
ISSN:0021-8979
年代: 1980
DOI:10.1063/1.328342
出版商: AIP
数据来源: AIP
摘要:
A collisional Monte Carlo electron transport model has been combined with an existing relativistic electron beam diode simulation code to investigate the effect of electron material interactions on diode performance. The effects of electron scattering and deposition in various anode materials on the electron beam profile are detailed. Simulations of two enhanced electron deposition experiments are described.
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