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A combined Monte Carlo diode simulation code

 

作者: J. P. Quintenz,   M. M. Widner,  

 

期刊: Journal of Applied Physics  (AIP Available online 1980)
卷期: Volume 51, issue 9  

页码: 4688-4692

 

ISSN:0021-8979

 

年代: 1980

 

DOI:10.1063/1.328342

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A collisional Monte Carlo electron transport model has been combined with an existing relativistic electron beam diode simulation code to investigate the effect of electron material interactions on diode performance. The effects of electron scattering and deposition in various anode materials on the electron beam profile are detailed. Simulations of two enhanced electron deposition experiments are described.

 

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