An investigation of GaAs films grown by MBE at low substrate temperatures and growth rates
作者:
G. M. Metze,
A. R. Calawa,
J. G. Mavroides,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena
(AIP Available online 1983)
卷期:
Volume 1,
issue 2
页码: 166-169
ISSN:0734-211X
年代: 1983
DOI:10.1116/1.582525
出版商: American Vacuum Society
关键词: films;molecular beam epitaxy;gallium arsenides;crystal growth;temperature effects;photoluminescence;electrical properties;crystal defects;high temperature;morphology;carrier density;mobility;laser radiation;silicon;activation energy;gallium oxides
数据来源: AIP
摘要:
We have achieved the first successful growth of GaAs films with good electrical properties at substrate temperatures below 480 °C. The electrical and photoluminescence properties of films grown atTs≊380 and 450 °C have been dramatically improved by reducing the growth rate significantly below the usual rate of ∼1 μm/h. Reductions in the growth rate can be expected to improve the quality of MBE films by allowing sufficient time for Ga and As adatoms to jump to equilibrium lattice positions before they are incorporated into the growing crystal by interacting with other adatoms. We further observed that the density of a major morphological defect of MBE GaAs films—the oval defect—was strongly correlated with the growth rate. The density of such defects was ∼500 cm−2for films grown at ∼0.02 μm/h.
点击下载:
PDF
(238KB)
返 回