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X‐Ray Diffraction Camera for Microtechniques

 

作者: Frank G. Chesley,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1947）
卷期: Volume 18, issue 6  

页码: 422-424

 

ISSN:0034-6748

 

年代: 1947

 

DOI:10.1063/1.1740964

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A description of an x‐ray diffraction camera for recording diffraction phenomena from selected microscopic regions of solid materials is presented. Replaceable collimator systems limit beam diameters from 100 to 25 microns. The camera body may be removed from its support and replaced without readjustment.

 

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