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Charge transfer adsorption in silicon vapor‐phase epitaxial growth

 

作者: A. Ishitani,   T. Takada,   Y. Ohshita,  

 

期刊: Journal of Applied Physics  (AIP Available online 1988)
卷期: Volume 63, issue 2  

页码: 390-394

 

ISSN:0021-8979

 

年代: 1988

 

DOI:10.1063/1.340250

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Silicon vapor‐phase epitaxial growth with SiH2Cl2is theoretically studied. The optimized geometries and total energies of the species, generated from SiH2Cl2, are calculated by using anabinitiomolecular orbital method. The charge transfer of the interaction between a silicon surface and SiCl2is considered. Based on the computational result that SiCl−2has the lower total energy that SiCl2, a new adsorption mechanism, named charge transfer adsorption, is proposed. By using this charge transfer adsorption followed by the surface reaction at the hollow bridge site, the epitaxial growths on the silicon (001), (111), and (110) surfaces are discussed. The epitaxial growths take place in different ways for these three surfaces because of the specific locations of the hollow bridge sites.

 

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