Removing drift from scanning probe microscope images of periodic samples
作者:
John T. Woodward,
Daniel K. Schwartz,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1998)
卷期:
Volume 16,
issue 1
页码: 51-53
ISSN:1071-1023
年代: 1998
DOI:10.1116/1.589834
出版商: American Vacuum Society
数据来源: AIP
摘要:
Thermal drift is frequently encountered when imaging with scanning probe microscopes. The drift skews real space images and distorts the reciprocal space lattice vectors. A settling time of up to 2 h is generally required to achieve relatively drift free images at the high magnifications needed for molecular or atomic resolution. We demonstrate a simple method to extract accurate lattice parameters from periodic samples which compensates for drift to first order (approximately constant drift rate), dramatically shortening the necessary waiting time. The method is based on averaging the apparent reciprocal lattice vectors corresponding to consecutive scans obtained in opposite scanning directions.
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