Interactions between implanted Mg and basep‐type dopant (Be,Zn,C) in heterojunction bipolar transistor devices
作者:
V. Amarger,
C. Dubon‐Chevallier,
Y. Gao,
B. Descouts,
期刊:
Journal of Applied Physics
(AIP Available online 1992)
卷期:
Volume 71,
issue 11
页码: 5694-5698
ISSN:0021-8979
年代: 1992
DOI:10.1063/1.351355
出版商: AIP
数据来源: AIP
摘要:
The interactions, in GaAlAs/GaAs heterojunction bipolar transistor structures, between implanted Mg atoms and differentp‐type base dopants (Be in layers grown by molecular beam epitaxy, Zn or C in layers grown by organometallic chemical vapor deposition) have been investigated. Different diffusion behaviors have been observed, according to the base dopant, either for the implanted Mg or for the base dopant itself. The resultant hole concentration profile obtained with aC–Velectrochemical profiler has also been studied as a function of the basep‐type dopant.
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