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Noncontacting optical probe

 

作者: Fang‐Sheng Jing,   A. W. Hartman,   R. J. Hocken,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1987)
卷期: Volume 58, issue 5  

页码: 864-868

 

ISSN:0034-6748

 

年代: 1987

 

DOI:10.1063/1.1139647

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A description is given of an optical probe, consisting of an optical microscope with modified internal illumination, a dual chopper with its two edges straddling the image plane, and a dual area sensor mounted behind the chopper. An analysis shows that the sensitivity of this proximity probe is essentially the same as that of the Simon probe, while its linearity is much better. Also, its construction is much simpler. A prototype has shown resolution of 0.02 &mgr;m and linearity errors of 0.5 &mgr;m (at 100‐&mgr;m range), respectively.

 

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