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Low temperature deposition of patterned TiO2thin films using photopatterned self‐assembled monolayers

 

作者: Rochael J. Collins,   Hyunjung Shin,   Mark R. DeGuire,   Arthur H. Heuer,   Chaim N. Sukenik,  

 

期刊: Applied Physics Letters  (AIP Available online 1996)
卷期: Volume 69, issue 6  

页码: 860-862

 

ISSN:0003-6951

 

年代: 1996

 

DOI:10.1063/1.117916

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Patterned thin films of TiO2were deposited from aqueous solution onto photopatterned self‐assembled monolayer (SAM) films on Si substrates. Regions of the SAM containing sulfonate surface functionality were created by the photo‐oxidation of initially deposited thioacetate groups through a mask. The nanocrystalline TiO2‐on‐SAM films were deposited selectively on the photolyzed regions of the SAM. The electrical properties of such films were assessed for potential microelectronic device applications. Current–voltage and capacitance–voltage measurements made on nonpatterned TiO2films yielded values of relative permittivity ranging from 24 to 57, film resistivities of 1.0–1.5×109&OHgr; cm and breakdown voltages in excess of 1 MV/cm. ©1996 American Institute of Physics.

 

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