Monte Carlo calculation of electron scattering from surface films
作者:
William Williamson,
A. J. Antolak,
期刊:
Journal of Applied Physics
(AIP Available online 1985)
卷期:
Volume 58,
issue 10
页码: 3687-3691
ISSN:0021-8979
年代: 1985
DOI:10.1063/1.335629
出版商: AIP
数据来源: AIP
摘要:
The electron backscattering coefficient and reflected energy for surface films on bulk substrates have been computed using the photon‐electron Monte Carlo transport codesandyl. The calculations were done for the film/substrate configurations Al/Pt, Ag/Pt, Ag/Al, and Au/Al with incident electron beam energies of 20, 40, 60, and 100 keV at different angles of incidence and various film thicknesses. The backscattering results are compared with available experimental data taken at normal incidence.
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