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Spurious electrons in electron spectrometers and their effect on differential electron impact ionization cross-section measurements

 

作者: M. E. Rudd,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1997)
卷期: Volume 68, issue 8  

页码: 3014-3018

 

ISSN:0034-6748

 

年代: 1997

 

DOI:10.1063/1.1148234

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The effect of the nonideal response characteristics of electrostatic analyzers is described and equations are derived, which allow a calculation of the distortion that this causes in measurements of angular and energy distributions of electrons from atomic collisions, especially in electron impact. Examples are given that show how a contamination as small as10−5from spurious electrons generated inside an analyzer can explain the peak seen at zero angle in some angular distribution measurements and the filling in of the minimum in the energy distributions in others. ©1997 American Institute of Physics.

 

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