Measurement and analysis of terahertz radiation from bulk semiconductors
作者:
M. Li,
F. G. Sun,
G. A. Wagoner,
M. Alexander,
X.‐C. Zhang,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 1
页码: 25-27
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.115480
出版商: AIP
数据来源: AIP
摘要:
We report the recent measurement and analysis of the transmitted and pseudoreflected optically induced terahertz (THz) beams emitted from a semiconductor wafer under femtosecond laser illumination, where the static electric field is either parallel or perpendicular to the surface. In general, the amplitude of the transmitted THz field is different from that of pseudoreflected THz field, except at the Brewster angle. ©1995 American Institute of Physics.
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