Fixed points for pressure calibration above 100 kbars related to semiconductor‐metal transitions
作者:
Akifumi Onodera,
Akihito Ohtani,
期刊:
Journal of Applied Physics
(AIP Available online 1980)
卷期:
Volume 51,
issue 5
页码: 2581-2585
ISSN:0021-8979
年代: 1980
DOI:10.1063/1.327984
出版商: AIP
数据来源: AIP
摘要:
Pressures assigned to the semiconductor‐metal transitions in ZnTe, ZnS, GaAs, and GaP have been determined by detecting the electrical resistance change of the semiconductors while the lattice parameter of standard material NaCl was simultaneously measured with x‐ray diffraction techniques. A pressure vessel of the split‐octahedron type and various pressure‐transmitting media have been employed. Pressures were estimated according to the equation of state for NaCl proposed by Decker. The transition pressures, 1296 kbars for ZnTe, 1557 kbars for ZnS, 1888 kbars for GaAs, and 25310 kbars for GaP, constitute fixed points for pressure calibration above 100 kbars at room temperature.
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