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Current Profile Monitor for Use in Scanning Electron Beam Irradiations

 

作者: Shigeru Okabe,   Kunihiko Tsumori,   Tatsuo Tabata,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1970)
卷期: Volume 41, issue 11  

页码: 1537-1539

 

ISSN:0034-6748

 

年代: 1970

 

DOI:10.1063/1.1684336

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A current profile monitor for the scanning electron beam from the accelerator is described. It utilizes the fact that the electrons scattered through large angles by the exit window of the scanner show a profile similar to that of the main beam at the irradiation site. The scattered electrons are collected by small probes arranged in a linear array parallel to the scanning direction, and the beam profile in this direction is displayed by a storage oscilloscope or an X‐Y recorder. This device has been used for electrons of energies 4–16 MeV from a linear accelerator and proved to be useful for continual monitoring with negligible disturbance to the irradiation in progress.

 

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