Current Profile Monitor for Use in Scanning Electron Beam Irradiations
作者:
Shigeru Okabe,
Kunihiko Tsumori,
Tatsuo Tabata,
期刊:
Review of Scientific Instruments
(AIP Available online 1970)
卷期:
Volume 41,
issue 11
页码: 1537-1539
ISSN:0034-6748
年代: 1970
DOI:10.1063/1.1684336
出版商: AIP
数据来源: AIP
摘要:
A current profile monitor for the scanning electron beam from the accelerator is described. It utilizes the fact that the electrons scattered through large angles by the exit window of the scanner show a profile similar to that of the main beam at the irradiation site. The scattered electrons are collected by small probes arranged in a linear array parallel to the scanning direction, and the beam profile in this direction is displayed by a storage oscilloscope or an X‐Y recorder. This device has been used for electrons of energies 4–16 MeV from a linear accelerator and proved to be useful for continual monitoring with negligible disturbance to the irradiation in progress.
点击下载:
PDF
(202KB)
返 回