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Cyclotron resonance measurements of the high electron mobility transistor

 

作者: Chian‐Sern Chang,   Harold R. Fetterman,   Arold Green,  

 

期刊: Applied Physics Letters  （AIP Available online 1990）
卷期: Volume 56, issue 1  

页码: 57-59

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.103184

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The photoconductivity cyclotron resonance measurement is used to determine the effective masses of the high electron mobility transistor. The experimental data show that the effective mass is a function of the gate voltage.

 

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