Fault location in Reed-Muller canonic networks
作者:
K.L.Kodandapani,
期刊:
Proceedings of the Institution of Electrical Engineers
(IET Available online 1977)
卷期:
Volume 124,
issue 4
页码: 345-348
年代: 1977
DOI:10.1049/piee.1977.0063
出版商: IEE
数据来源: IET
摘要:
In the paper, single and multiple-fault locating test sets for Reed-Muller canonic networks are derived. The fault model assumes stuck-at faults at theI/Oleads of AND gates, and that an EOR gate under a fault can produce any other function of two inputs other than equivalence. The results in the paper give an insight into the complexity of testing of a class of logic networks.
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