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Effect of Crystal Thickness and Geometry on the Alpha‐Particle Resolution of CsI (Tl)

 

作者: Prudencio Martinez,   Frank E. Senftle,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1960)
卷期: Volume 31, issue 9  

页码: 974-977

 

ISSN:0034-6748

 

年代: 1960

 

DOI:10.1063/1.1717121

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The resolution of CsI(Tl) for Po210alpha particles has been measured as a function of crystal thickness. The best resolution of a ½‐in. diam cylindrical crystal was obtained for a thickness of 0.38 mm, and the effect of thickness on the resolution is discussed. Based on the proposed model, a conical crystal was designed, which yielded a line width of 1.8% for Po210alpha particles with a selected photomultiplier tube.

 

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