Effect of Crystal Thickness and Geometry on the Alpha‐Particle Resolution of CsI (Tl)
作者:
Prudencio Martinez,
Frank E. Senftle,
期刊:
Review of Scientific Instruments
(AIP Available online 1960)
卷期:
Volume 31,
issue 9
页码: 974-977
ISSN:0034-6748
年代: 1960
DOI:10.1063/1.1717121
出版商: AIP
数据来源: AIP
摘要:
The resolution of CsI(Tl) for Po210alpha particles has been measured as a function of crystal thickness. The best resolution of a ½‐in. diam cylindrical crystal was obtained for a thickness of 0.38 mm, and the effect of thickness on the resolution is discussed. Based on the proposed model, a conical crystal was designed, which yielded a line width of 1.8% for Po210alpha particles with a selected photomultiplier tube.
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