首页   按字顺浏览 期刊浏览 卷期浏览 Adaptation of a Geiger‐Counter X‐Ray Diffractometer for High‐Tempe...
Adaptation of a Geiger‐Counter X‐Ray Diffractometer for High‐Temperature Investigations

 

作者: P. Chiotti,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1954)
卷期: Volume 25, issue 7  

页码: 683-688

 

ISSN:0034-6748

 

年代: 1954

 

DOI:10.1063/1.1771159

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The construction of a specimen holder and furnace for use as an auxilary piece of equipment with a North American Phillips Company high angle goniometer is described. The apparatus can be used for obtaining x‐ray diffraction patterns at temperatures up to 1600°C, and at pressures in the range of 2×10−6to 3×10−5mm of mercury.

 

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