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Transport properties of GaAs‐AlxGa1−xAs heterojunction field‐effect transistors

 

作者: D. C. Tsui,   A. C. Gossard,   G. Kaminsky,   W. Wiegmann,  

 

期刊: Applied Physics Letters  (AIP Available online 1981)
卷期: Volume 39, issue 9  

页码: 712-714

 

ISSN:0003-6951

 

年代: 1981

 

DOI:10.1063/1.92858

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report low field transport properties ofn‐channel GaAs‐AlxGa1−xAs heterojunction field‐effect transistors. Studies of the Shubnikov‐de Haas effect confirm that the devices are insulated‐gate field‐effect transistors, with AlxGa1−xAs as the gate insulator. The channel mobility increases with density following &mgr;2∼n&ggr;, with &ggr; varying from 0.45 to 1.4. &mgr; = 1.2×105cm2/V sec at 78 K and 3.6×105cm2/V sec at 4.2 K are observed atn∼4×1011/cm2.

 

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