Transport properties of GaAs‐AlxGa1−xAs heterojunction field‐effect transistors
作者:
D. C. Tsui,
A. C. Gossard,
G. Kaminsky,
W. Wiegmann,
期刊:
Applied Physics Letters
(AIP Available online 1981)
卷期:
Volume 39,
issue 9
页码: 712-714
ISSN:0003-6951
年代: 1981
DOI:10.1063/1.92858
出版商: AIP
数据来源: AIP
摘要:
We report low field transport properties ofn‐channel GaAs‐AlxGa1−xAs heterojunction field‐effect transistors. Studies of the Shubnikov‐de Haas effect confirm that the devices are insulated‐gate field‐effect transistors, with AlxGa1−xAs as the gate insulator. The channel mobility increases with density following &mgr;2∼n&ggr;, with &ggr; varying from 0.45 to 1.4. &mgr; = 1.2×105cm2/V sec at 78 K and 3.6×105cm2/V sec at 4.2 K are observed atn∼4×1011/cm2.
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