首页   按字顺浏览 期刊浏览 卷期浏览 Electron Beam Evaporator forIn SituElectron Microscope Studies
Electron Beam Evaporator forIn SituElectron Microscope Studies

 

作者: K. H. Olsen,   T. E. Hutchinson,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1965)
卷期: Volume 36, issue 12  

页码: 1753-1755

 

ISSN:0034-6748

 

年代: 1965

 

DOI:10.1063/1.1719457

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A device for evaporating metals by electron beam bombardment within the electron microscope has been developed which operates without loss of image resolution or stability. This device is particularly applicable to dynamic studies of nucleation and growth of metallic films characterized by unusually high purity and/or high melting points. A hanging drop of molten material, formed by bombardment of the end of a vertical wire by a focused beam of 2–5 kV electrons, provides a controllable source of pure metal vapor.

 

点击下载:  PDF (297KB)



返 回