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Knife‐edge thin film field emission cathodes on (110) silicon wafers

 

作者: Bo Lee,   T. S. Elliott,   T. K. Mazumdar,   P. M. McIntyre,   Y. Pang,   H. J. Trost,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1994)
卷期: Volume 12, issue 2  

页码: 644-647

 

ISSN:1071-1023

 

年代: 1994

 

DOI:10.1116/1.587404

 

出版商: American Vacuum Society

 

关键词: SILICON;THIN FILMS;FIELD EMISSION;ELECTRON SOURCES;CATHODES;FABRICATION;FOWLER−NORDHEIM THEORY;TESTING;Si

 

数据来源: AIP

 

摘要:

In the effort to develop a high performance field emission cathode for application in microwave amplifiers, it is clear that the emitter structure should have a sharp emitter surface, a large emitter height, a small gate opening size, and a small emitter angle. We have developed a technique that fabricates knife‐edge field emission arrays (KEFEA) on (110) silicon wafers. KEFEA has an optimized structure meeting the requirements mentioned above. The emitter edge radius is about 250 Å or less, the emitter height is 8 μm, and the gate gap is ∼0.2 μm. Experiments have exhibited Fowler–Nordheim type field emission with gate‐to‐substrate bias voltage less than 50 V.

 

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