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Characterization of piezoelectric (111)B InGaAs/GaAsp-i-nquantum well structures using photoreflectance spectroscopy

 

作者: C. H. Chan,   M. C. Chen,   H. H. Lin,   Y. F. Chen,   G. J. Jan,   Y. H. Chen,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 10  

页码: 1208-1210

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.121015

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Strained-layer (111)BIn0.2Ga0.8As/GaAsp-i-nquantum well structures grown with exciton transitions well resolved at room temperature have been studied by photoreflectance spectroscopy. Using the reduced mass deduced from experiments, the built-in electric field in the barrier region is obtained from the above band-gap Franz–Keldysh oscillations. The strain-induced piezoelectric field is then determined directly from a comparison of the periods of Franz–Keldysh oscillations in different samples. Numerical solutions for the exciton transitions from the derived potential profiles are in good agreement with the experimental results. The piezoelectric constant is also determined using the piezoelectric field. ©1998 American Institute of Physics.

 

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