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Grazing incidence reflectivity and total electron yield effects in soft x-ray absorption spectroscopy

 

作者: D. Alders,   T. Hibma,   G. A. Sawatzky,   K. C. Cheung,   G. E. van Dorssen,   M. D. Roper,   H. A. Padmore,   G. van der Laan,   J. Vogel,   M. Sacchi,  

 

期刊: Journal of Applied Physics  （AIP Available online 1997）
卷期: Volume 82, issue 6  

页码: 3120-3124

 

ISSN:0021-8979

 

年代: 1997

 

DOI:10.1063/1.366153

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report on a study of grazing incidence absorption and reflection spectra of NiO in the region of the Ni2pedge. The aim is to evaluate the distortion of the near edge spectrum by the critical angle behavior of individual components within the spectrum. This can be used to improve the separation of multiplets and enhance low spectral weight line shapes like charge transfer satellites. The measured spectra have been compared with calculations using an optical model. ©1997 American Institute of Physics.

 

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