Prediction of equilibrium concentrations of defects and factors that influence them
作者:
Otto F. Sankey,
Robert W. Jansen,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena
(AIP Available online 1988)
卷期:
Volume 6,
issue 4
页码: 1240-1244
ISSN:0734-211X
年代: 1988
DOI:10.1116/1.584243
出版商: American Vacuum Society
关键词: CRYSTAL DEFECTS;DOPING PROFILES;SEMICONDUCTOR MATERIALS;INTERSTITIALS;VACANCIES;IMPURITY STATES;TEMPERATURE EFFECTS;HOLES;STOICHIOMETRY
数据来源: AIP
摘要:
An extensive theoretical study has been made on the factors that influence the formation of native defects and extrinsic impurity incorporation in semiconductors. A complete set of reaction equations within equilibrium statistical mechanics is used to predict defect concentrations of intrinsic and extrinsic defects. The competing reactions involving host atoms include vacancies, antisites, and interstitial defects and the extrinsic impurity reactions include anion and cation site substitutional and interstitial site impurities. The extrinsic and intrinsic reactions form a coupled system. Examples are given to illustrate how various factors influence defect abundances, and such factors include temperature, stoichiometry, the host material, and the chemical potential of the electron/hole system. It is found that extrinsic impurities have a profound effect on native defect abundances. The defect formation energies used in the theory are obtained from a recently developed pseudoatomic‐orbital scheme using the local density approximation and pseudopotentials.
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