We analyze measurements of the x‐ray reflectivity and photoelectron yield of a Ni‐C multilayer (103 layers;d=31 A˚) in the NiL‐edge region (700–950 eV). The measured reflectivity is shown to be consistent with the one calculated using x‐ray scattering factors  f1and  f2for Ni as obtained from the photoelectron yield (∼f2). The analysis yields a new set of ‘‘effective’’ values for  f1in the NiL‐edge region.