Direct measurement of spectral emissivity of liquid Si in the range of visible light
作者:
Eiryo Takasuka,
Eiji Tokizaki,
Kazutaka Terashima,
Shigeyuki Kimura,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 2
页码: 152-154
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.114650
出版商: AIP
数据来源: AIP
摘要:
Normal spectral emissivity of liquid Si was determined by direct measurement of thermal radiations from a surface of the Si melt and a blackbody cavity. The spectral emissivity has little dependence on the wavelength. The emissivity is 0.27 for the wavelength from 500 to 800 nm and is about a half of that of solid silicon at the melting point. Temperature dependence of the emissivity is very small in the temperature range from the melting point to 1550 °C. Free‐electron model with a plasma frequency and relaxation time of the order of 1016Hz gives a good agreement with the experimental result. That indicates the dominant effect of the free electrons on the optical properties of the liquid Si. ©1995 American Institute of Physics.
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