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Direct measurement of spectral emissivity of liquid Si in the range of visible light

 

作者: Eiryo Takasuka,   Eiji Tokizaki,   Kazutaka Terashima,   Shigeyuki Kimura,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 67, issue 2  

页码: 152-154

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.114650

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Normal spectral emissivity of liquid Si was determined by direct measurement of thermal radiations from a surface of the Si melt and a blackbody cavity. The spectral emissivity has little dependence on the wavelength. The emissivity is 0.27 for the wavelength from 500 to 800 nm and is about a half of that of solid silicon at the melting point. Temperature dependence of the emissivity is very small in the temperature range from the melting point to 1550 °C. Free‐electron model with a plasma frequency and relaxation time of the order of 1016Hz gives a good agreement with the experimental result. That indicates the dominant effect of the free electrons on the optical properties of the liquid Si. ©1995 American Institute of Physics.

 

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