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Comment on ‘‘Rectification in heavily dopedp‐type GaAs/AlAs heterojunctions’’ [J. Appl. Phys.70, 1081 (1991)]

 

作者: E. Zeeb,   K. J. Ebeling,  

 

期刊: Journal of Applied Physics  (AIP Available online 1992)
卷期: Volume 71, issue 11  

页码: 5729-5729

 

ISSN:0021-8979

 

年代: 1992

 

DOI:10.1063/1.350514

 

出版商: AIP

 

数据来源: AIP

 

摘要:

In his recent paper ‘‘Rectification in heavily dopedp‐type GaAs/AlAs heterojunctions’’ [J. Appl. Phys.70, 1081 (1991)] Yoffe presented calculations of barrier heights and current‐voltage characteristics. Unfortunately, he adopted a typographical error in his basic equations. In this comment we show that significant differences in barrier heights and currents across heterojunctions arise, using the corrected expression for the calculations.

 

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