Comment on ‘‘Rectification in heavily dopedp‐type GaAs/AlAs heterojunctions’’ [J. Appl. Phys.70, 1081 (1991)]
作者:
E. Zeeb,
K. J. Ebeling,
期刊:
Journal of Applied Physics
(AIP Available online 1992)
卷期:
Volume 71,
issue 11
页码: 5729-5729
ISSN:0021-8979
年代: 1992
DOI:10.1063/1.350514
出版商: AIP
数据来源: AIP
摘要:
In his recent paper ‘‘Rectification in heavily dopedp‐type GaAs/AlAs heterojunctions’’ [J. Appl. Phys.70, 1081 (1991)] Yoffe presented calculations of barrier heights and current‐voltage characteristics. Unfortunately, he adopted a typographical error in his basic equations. In this comment we show that significant differences in barrier heights and currents across heterojunctions arise, using the corrected expression for the calculations.
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