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X‐Ray Diffraction Methods

 

作者: B. E. Warren,  

 

期刊: Journal of Applied Physics  （AIP Available online 1941）
卷期: Volume 12, issue 5  

页码: 375-384

 

ISSN:0021-8979

 

年代: 1941

 

DOI:10.1063/1.1712915

 

出版商: AIP

 

数据来源: AIP

 

摘要:

To learn more about the identification of crystalline materials, preferred orientations, particle sizes, strains, and structure randomness, x‐ray diffraction is used. Here both basic principles and working techniques are described.

 

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