首页   按字顺浏览 期刊浏览 卷期浏览 Autocorrelation testing of combinational circuits
Autocorrelation testing of combinational circuits

 

作者: S.Aborhey,  

 

期刊: IEE Proceedings E (Computers and Digital Techniques)  (IET Available online 1989)
卷期: Volume 136, issue 1  

页码: 57-61

 

年代: 1989

 

DOI:10.1049/ip-e.1989.0008

 

出版商: IEE

 

数据来源: IET

 

摘要:

This paper considers autocorrelation testing for the detection of single stuck-at faults on non-syndrome testable input lines of an internally unate combinational network. The question of an autocorrelation test covering more than one input fault is considered. Also a test circuitry which requires only 2ninput assignments for ann-input system is presented. The work of this paper is an extension of previous work on autocorrelation testing by Eris and Muzio [6].

 

点击下载:  PDF (455KB)



返 回