Autocorrelation testing of combinational circuits
作者:
S.Aborhey,
期刊:
IEE Proceedings E (Computers and Digital Techniques)
(IET Available online 1989)
卷期:
Volume 136,
issue 1
页码: 57-61
年代: 1989
DOI:10.1049/ip-e.1989.0008
出版商: IEE
数据来源: IET
摘要:
This paper considers autocorrelation testing for the detection of single stuck-at faults on non-syndrome testable input lines of an internally unate combinational network. The question of an autocorrelation test covering more than one input fault is considered. Also a test circuitry which requires only 2ninput assignments for ann-input system is presented. The work of this paper is an extension of previous work on autocorrelation testing by Eris and Muzio [6].
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