作者: Y. Shao, F. Spaepen,
期刊: Journal of Applied Physics (AIP Available online 1996) 卷期: Volume 79, issue 6
页码: 2981-2985
ISSN:0021-8979
年代: 1996
DOI:10.1063/1.361222
出版商: AIP
数据来源: AIP
摘要:
Drops of molten silicon surrounded by a SiO2–BaO–CaO flux were undercooled at 350 K below their melting temperature. This undercooling is 75 K greater than the largest one reported so far for bulk silicon. To account for this result as well as the nucleation data from laser‐melted thin films, classical nucleation theory requires a crystal‐melt interfacial tension with a positive temperature coefficient. ©1996 American Institute of Physics.
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