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Study of dynamic current distribution in logic circuits by Joule displacement microscopy

 

作者: Y. Martin,   H. K. Wickramasinghe,  

 

期刊: Applied Physics Letters  （AIP Available online 1987）
卷期: Volume 50, issue 3  

页码: 167-168

 

ISSN:0003-6951

 

年代: 1987

 

DOI:10.1063/1.97650

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Joule displacement microscopy, where the periodic expansion caused by Joule heating in a thin‐film track carrying ac current is mapped using a focused probe, has recently been described. In this letter, we demonstrate the application of this technique to the study of current distribution within a bipolar inverting gate.

 

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