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Photoexcitation of50Cr,53Cr and the Debye Temperature of Chromium

 

作者: D. Levant,   R. Moreh,   O. Shahal,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1991)
卷期: Volume 238, issue 1  

页码: 1011-1013

 

ISSN:0094-243X

 

年代: 1991

 

DOI:10.1063/1.41156

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The random photoexcitation process ofn‐capture &ggr;‐rays was used for studying the decay properties of the 8888 keV level in50Cr and a level at 7646 keV in53Cr. The &ggr; source was obtained from the Fe(n,&ggr;) reaction. The scattering cross section &sgr;sfrom the 8888‐keV level was measured in the range 297 K–10 K and the Debye temperature of metallic chromium was found to be &THgr;=510±20 K. The result is compared with that obtained by other methods.

 

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