Photoexcitation of50Cr,53Cr and the Debye Temperature of Chromium
作者:
D. Levant,
R. Moreh,
O. Shahal,
期刊:
AIP Conference Proceedings
(AIP Available online 1991)
卷期:
Volume 238,
issue 1
页码: 1011-1013
ISSN:0094-243X
年代: 1991
DOI:10.1063/1.41156
出版商: AIP
数据来源: AIP
摘要:
The random photoexcitation process ofn‐capture &ggr;‐rays was used for studying the decay properties of the 8888 keV level in50Cr and a level at 7646 keV in53Cr. The &ggr; source was obtained from the Fe(n,&ggr;) reaction. The scattering cross section &sgr;sfrom the 8888‐keV level was measured in the range 297 K–10 K and the Debye temperature of metallic chromium was found to be &THgr;=510±20 K. The result is compared with that obtained by other methods.
点击下载:
PDF
(150KB)
返 回