Photoluminescence study of the optical properties of SiGe quantum wells on separation by implanted oxygen substrates
作者:
Deepak K. Nayak,
Noritaka Usami,
Susumu Fukatsu,
Yasuhiro Shiraki,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 81,
issue 8
页码: 3484-3489
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.365046
出版商: AIP
数据来源: AIP
摘要:
A detailed experimental study of the optical properties of separation by implanted oxygen (SIMOX) substrates is performed using photoluminescence techniques. The photoluminescence properties of SIMOX substrates are compared with those of Si substrates. The silicon-on-insulator (SOI) layer is found to be free of any strain. High-quality SiGe quantum wells are grown on SOI using gas source molecular beam epitaxy. It is found that the photoluminescence properties of these quantum wells on SOI differ significantly from those of the SiGe quantum wells grown on a Si substrate under identical growth conditions. Intense photoluminescence and higher operation temperature are obtained for quantum wells grown on SOI substrates. It is shown that growth of a few hundred Å Si buffer layer on SOI is essential in order to achieve a high quality SiGe epitaxy on SOI. Finally, aSiO2/Si/SiO2optical cavity is proposed on SIMOX substrates, and it is employed to further enhance the photoluminescence intensity of SiGe quantum wells on SOI. ©1997 American Institute of Physics.
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