Epitaxial films (1.7 &mgr;m thick) with the compositionPbFe12.9O22.9and hexagonal lattice parametersa=5.12 Å andc=23.67 Å have been pulsed laser deposited at 600 °C in 50 mTorr ofO2onto single-crystal (0001) sapphire substrates. Epitaxy was determined using standard powder x-ray diffraction (XRD) and grazing incidence XRD. The films were deposited using a single-phase polycrystallinePbFe12O19target. The composition of the films isPbFe12.9O22.9,which was measured using Rutherford backscattering spectrometry. Static magnetic measurements were performed using a vibrating sample magnetometer and SQUID magnetometer in order to measure magnetic anisotropy, magnetic remanence(Mr),coercive field(Hc),and saturation magnetization(4&pgr;Ms)of the films. ThePbFe12.9O22.9films exhibit magnetically isotropic behavior in the film plane with remanence ratio(Mr/Ms)andHcvalues of 88±2.9&percent; and 2500±97 Oe, respectively. However, the films are anisotropic with respect to the film normal such that thecaxis is a magnetically hard direction and all directions normal to thecaxis are magnetically easy (i.e., a planar anisotropy field,HA,with an estimated magnitude of 77.5 kOe). The4&pgr;Msvalue for the films is 630 Gauss at room temperature. ©1997 American Institute of Physics.