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Grain boundary recombination: Theory and experiment in silicon

 

作者: C. H. Seager,  

 

期刊: Journal of Applied Physics  (AIP Available online 1981)
卷期: Volume 52, issue 6  

页码: 3960-3968

 

ISSN:0021-8979

 

年代: 1981

 

DOI:10.1063/1.329202

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Calculations have been made of the barrier heights and recombination velocities at semiconductor grain boundaries subject to uniform illumination with above‐band‐gap light. A detailed balance approach has been coupled with a solution of the current continuity equation to yield a full solution of the problem subject to the approximation that majority carrier currents can be properly described by thermionic emission expressions. Silicon bicrystal data are presented and shown to be in good agreement with the predictions of the theory.

 

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