首页   按字顺浏览 期刊浏览 卷期浏览 Test pattern for fluorescence microscopy
Test pattern for fluorescence microscopy

 

作者: G. C. A. M. Janssen,   B. A. C. Rousseeuw,   H. T. M. van der Voort,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1987）
卷期: Volume 58, issue 4  

页码: 598-599

 

ISSN:0034-6748

 

年代: 1987

 

DOI:10.1063/1.1139222

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A fluorescent test pattern with submicron dimensions has been produced. With this test pattern the optical characteristics of a confocal scanning laser microscope can be determined. The fabrication procedure of the test pattern and the raw data obtained in a measurement of the transfer function of the confocal scanning laser microscope are presented.

 

点击下载:  PDF (288KB)



返 回