Ferroelectric Na0.5K0.5NbO3thin films by pulsed laser deposition
作者:
Choong-Rae Cho,
Alex Grishin,
Byung-Moo Moon,
期刊:
Integrated Ferroelectrics
(Taylor Available online 2000)
卷期:
Volume 31,
issue 1-4
页码: 35-45
ISSN:1058-4587
年代: 2000
DOI:10.1080/10584580008215638
出版商: Taylor & Francis Group
关键词: preferential orientation;self-assembling;low loss;MFIS-diode
数据来源: Taylor
摘要:
Highly c-axis oriented single phase Na0.5K0.5NbO3(NKN) thin films have been deposited onto polycrystalline Pt80lr20substrates and SiO2/Si(001) wafers using pulsed laser ablation of stoichiometric ceramic target. Strong self-assembling of NKN films along the [001] direction has been observed. Properties of NKN/Pt thin film structures have been successfully tailored by oxygen pressure control from the ferroelectric state, characterized by the remnant polarization of 12 uC/cm2, dielectric constant ε ∼ 520 andtanδ ∼ 0.024 @ 100 kHz, to superparaelectric state withtanδ as low as 0.003 and ε = 210 with very small 1.7% dispersion in the frequency domain 0.4–100 kHz and less than 10% variation in the temperature range 77–415 K. NKN films grown onto SiO2/Si(001) substrates show quadrupled super-lattice structure alongc-axis, losstanδ less than 0.01, and ε ∼ 110 @ 1 MHz.C-V measurements for Au/NKN (270nm)/SiO2/Si MFIS-diode structure yield memory window of 3.26 V at the programmable voltage of 8 V.
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