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Auger recombination dynamics ofHg0.795Cd0.205Tein the high excitation regime

 

作者: C. M. Ciesla,   B. N. Murdin,   T. J. Phillips,   A. M. White,   A. R. Beattie,   C. J. G. M. Langerak,   C. T. Elliott,   C. R. Pidgeon,   S. Sivananthan,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 4  

页码: 491-493

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119588

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A direct measurement of carrier recombination, far from equilibrium, inHg0.795Cd0.205Te(Nd−Na=3.3×1014 cm−3)has been made on a picosecond time scale with a pump–probe technique using a free-electron laser. Over the range of carrier densities(5×1016–3×1017 cm−3)and at the temperatures (50–300 K) studied experimentally, contributions to the recombination from Auger, Shockley–Read–Hall, and radiative mechanisms were calculated using an analytic approximation, with carrier degeneracy included, Auger-1 (CCCH) recombination rates were calculated, which also gave the Auger-7 (CHHL) rates via a simple relationship. Excellent agreement was obtained, with Auger-1 dominant at all temperatures and, significantly, forT>225 Kwhen the sample is intrinsic, the Auger-7 contribution was found to be important. ©1997 American Institute of Physics.

 

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