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Duoplasmatron Ion Beam Source for Vacuum Sputtering of Thin Films

 

作者: K. L. Chopra,   M. R. Randlett,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1967)
卷期: Volume 38, issue 8  

页码: 1147-1151

 

ISSN:0034-6748

 

年代: 1967

 

DOI:10.1063/1.1721039

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A variation of the von Ardenne type of a duoplasmatron ion source is described. Here the arc discharge is maintained between the cathode in the high pressure and the anode in the vacuum chamber, as opposed to the conventional arrangement in which the arc discharge is confined primarily to the high pressure chamber. This modification allows the extraction, through apertures, of a well defined ion beam of current up to 500 mA over an area ∼1 cm2into a vacuum chamber at a pressure of ∼10−5Torr. The ion beam is accelerated and made to impinge on a target material for sputtering. Sequential sputtering of different targets inside the vacuum chamber is possible with the help of suitable magnetic fields. The ion beam has been used to sputter conducting, semiconducting, and insulating target materials. Typical rate of deposition of silver films at a distance of 8 cm from the target with a 50 mA, 2 kV ion beam of 8 mm diam is ∼400 Å/min. Deposition rates of ∼50 Å/min are obtained for SiO2and TiO films. Vacuum sputtered films adhere to the subtrates much more strongly than the evaporated films do. Gold and silver films grow epitaxially on rock salt substrates at ambient or lower temperatures. This vacuum sputtering process has been found to induce and stabilize new structures. For example, sputtered films of molybdenum, tantalum, tungsten (normally bcc), and hafnium, rhenium and zirconium (normally hcp) have been observed to exist in an fcc phase. Fcc structure films as thick as 2 &mgr; have been prepared. Epitaxial growth of the fcc structures on rock salt substrates at temperatures of ∼400°C are observed.

 

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