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Effect of magnetometer response on magnetization behavior of &bgr;′‐NiAl phase under constant applied field

 

作者: Seung‐Am Cho,   Agusti´n Jaque,  

 

期刊: Journal of Applied Physics  (AIP Available online 1980)
卷期: Volume 51, issue 9  

页码: 4577-4579

 

ISSN:0021-8979

 

年代: 1980

 

DOI:10.1063/1.328349

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Magnetization and demagnetization behaviors of ordered &bgr;′‐NiAl B2 phase are measured as a function of time under the constant applied fields by varying the electronic circuit time constant &tgr;cof magnetometer. It is clarified that the &bgr;′‐NiAl does not have magnetic after effect at room temperature. The after effect of the phase observed previously at &tgr;c=30 sec was found to be the circuit response of the measurement system. This response showed the Voigt‐Kelvin type anelastic behavior.

 

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